1991 International Conference on Solid State Devices and Materials
1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan
1991 International Conference on Solid State Devices and Materials
1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan
[A-2-2]A Comparative Study of High-Field Endurance for Reoxidized-Nitrided and Fluorinated Oxides
Z. H. Liu、P. Nee、P. K. Ko、C. Hu、C. G. Sodini、B. J. Gross、T. P. Ma、Y. C. Cheng(1.Department of EECS, University of California、2.Department of EECS, Massachusetts Institute of Technology、3.Department of Electrical Engineering, Yale University、4.Directorate, City Polytechnic of Hong Kong)
