1992 International Conference on Solid State Devices and Materials

1992 International Conference on Solid State Devices and Materials

1992年8月26日〜8月28日Tsukuba Center Building, Tsukuba, Japan
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International Conference on Solid State Devices and Materials
1992 International Conference on Solid State Devices and Materials

1992 International Conference on Solid State Devices and Materials

1992年8月26日〜8月28日Tsukuba Center Building, Tsukuba, Japan

[PA1-8]Characterization of HF-Treated Si Surfaces by Photoluminescence Spectroscopy and Scanning Tunneling Microscopy

Tomohiro KONISHI、Katsuhiro UESUGI、Seiji KAWANO、Takafumi YAO、Hisayoshi OHSHIMA、Hiroyasu ITO、Tadashi HATTORI(1.Department of Electrical Engineering, Hiroshima University、2.Research Laboratories Nippondenso Co., Ltd.)
https://doi.org/10.7567/SSDM.1992.PA1-8
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