1992 International Conference on Solid State Devices and Materials

1992 International Conference on Solid State Devices and Materials

1992年8月26日〜8月28日Tsukuba Center Building, Tsukuba, Japan
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International Conference on Solid State Devices and Materials
1992 International Conference on Solid State Devices and Materials

1992 International Conference on Solid State Devices and Materials

1992年8月26日〜8月28日Tsukuba Center Building, Tsukuba, Japan

[PA2-1]Dynamic Shielding of Substrate Bias Effects on Electrical Characteristics of High Voltage IGBTs on SOI

Akio Nakagawa、Tomoko Matsudai、Ichiro Omura(1.Toshiba Corporation)
https://doi.org/10.7567/SSDM.1992.PA2-1
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