1995 International Conference on Solid State Devices and Materials

1995 International Conference on Solid State Devices and Materials

1995年8月21日〜8月24日International House, Osaka, Japan
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International Conference on Solid State Devices and Materials
1995 International Conference on Solid State Devices and Materials

1995 International Conference on Solid State Devices and Materials

1995年8月21日〜8月24日International House, Osaka, Japan

[D-1-2]Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy

Masafumi TANIMOTO、Kiyoshi KANISAWA、Masanori SHINOHARA(1.NTT LSI Laboratories、2.NTT Basic Research Laboratories)
https://doi.org/10.7567/SSDM.1995.D-1-2
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