1996 International Conference on Solid State Devices and Materials

1996 International Conference on Solid State Devices and Materials

1996年8月26日〜8月29日Pacifico Yokohama, Yokohama, Japan
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International Conference on Solid State Devices and Materials
1996 International Conference on Solid State Devices and Materials

1996 International Conference on Solid State Devices and Materials

1996年8月26日〜8月29日Pacifico Yokohama, Yokohama, Japan

[D-2-2]Kelvin Probe Force Microscopy for Potential Distribution Measurement of Cleaved Surface of GaAs Devices

Masashi ARAKAWA、Shigeru KISHIMOTO、Takashi MIZUTANI(1.Department of Quantum Engineering, Nagoya University)
https://doi.org/10.7567/SSDM.1996.D-2-2
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