1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

1997年9月16日〜9月19日ACT CITY Hamamatsu, Hamamatsu, Japan
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International Conference on Solid State Devices and Materials
1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

1997年9月16日〜9月19日ACT CITY Hamamatsu, Hamamatsu, Japan

[A-3-2]Gate Voltage Dependence of Reliability for Ultra-Thin Oxides

Tanya Nigam、Michel Depas、Robin Degraeve、Marc M. Heyns、Guido Groeseneken(1.IMEC)
https://doi.org/10.7567/SSDM.1997.A-3-2
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