1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

1997年9月16日〜9月19日ACT CITY Hamamatsu, Hamamatsu, Japan
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International Conference on Solid State Devices and Materials
1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

1997年9月16日〜9月19日ACT CITY Hamamatsu, Hamamatsu, Japan

[A-3-3]An Experimental Evidence to Link the Origins of "A Mode" and "B Mode" Stress Induced Leakage Current

Kenji Okada(1.ULSI Process Technology Development Center, Matsushita Electronics Corporation)
https://doi.org/10.7567/SSDM.1997.A-3-3
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