[LA-3]Improvement of SiO2/4H-SiC Interface by Using High Temperature Hydrogen Annealing at 1000℃
Kenji Fukuda、Kiyoko Nagai、Toshihiro Sekigawa、Sadafumi Yoshida、Kazuo Arai、Masahito Yoshikawa(1.New Energy and Industrial Technology Development Organization, Electrotechnical Laboratory、2.Japan Atomic Energy Research Institute)
