1999 International Conference on Solid State Devices and Materials

1999 International Conference on Solid State Devices and Materials

1999年9月21日〜9月24日Nihon Toshi Center Kaikan, Tokyo, Japan
戻る
International Conference on Solid State Devices and Materials
1999 International Conference on Solid State Devices and Materials

1999 International Conference on Solid State Devices and Materials

1999年9月21日〜9月24日Nihon Toshi Center Kaikan, Tokyo, Japan

[A-2-4]Simulation of Temperature Dependence of Microwave Noise in MOS Transistors

Michael Obrecht、Tajinder Manku(1.RF Technology Group, Electrical and Computer Engineering Department, University of Waterloo)
https://doi.org/10.7567/SSDM.1999.A-2-4
PDFダウンロードPDFダウンロード
戻る