1999 International Conference on Solid State Devices and Materials

1999 International Conference on Solid State Devices and Materials

1999年9月21日〜9月24日Nihon Toshi Center Kaikan, Tokyo, Japan
戻る
International Conference on Solid State Devices and Materials
1999 International Conference on Solid State Devices and Materials

1999 International Conference on Solid State Devices and Materials

1999年9月21日〜9月24日Nihon Toshi Center Kaikan, Tokyo, Japan

[B-1-2]Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED

Jong-Wan Jung、Jong-Min Kim、Jeong-Hwan Son、Shin-Young Chung、Young-Jong Lee、Hyun-Cheol Kim、Kyung-Ho Lee(1.LG Semicon Co., Ltd.)
https://doi.org/10.7567/SSDM.1999.B-1-2
PDFダウンロードPDFダウンロード
戻る