2000 International Conference on Solid State Devices and Materials

2000 International Conference on Solid State Devices and Materials

2000年8月29日〜8月31日Sendai International Center, Sendai, Japan
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International Conference on Solid State Devices and Materials
2000 International Conference on Solid State Devices and Materials

2000 International Conference on Solid State Devices and Materials

2000年8月29日〜8月31日Sendai International Center, Sendai, Japan

[B-1-1]Deuterium Effect on Both Interface-State Generation and Stress-Induced-Leakage-Current under Fowler-Nordheim Electron Injection

Yuichiro Mitani、Hideki Satake、Hitoshi Ito、Akira Toriumi(1.Advanced LSI Technology Laboratory, Toshiba Corp.)
https://doi.org/10.7567/SSDM.2000.B-1-1
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