2002 International Conference on Solid State Devices and Materials

2002 International Conference on Solid State Devices and Materials

2002年9月17日〜9月19日Nagoya Congress Center, Nagoya, Japan
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International Conference on Solid State Devices and Materials
2002 International Conference on Solid State Devices and Materials

2002 International Conference on Solid State Devices and Materials

2002年9月17日〜9月19日Nagoya Congress Center, Nagoya, Japan

[A-2-3]Statistical Modeling of MOS Devices for Parametric Yield Prediction

Juin J. Liou、Qiang Zhang、John McMacken、J. Ross Thomson、Kevin Stiles、Paul Layman(1.School of EE and CS, University of Central Florida、2.Modeling and Simulation Group, Agere Systems)
https://doi.org/10.7567/SSDM.2002.A-2-3
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