[A-1-3]Extendibility of High Mobility HfSiON Gate Dielectrics
Seiji Inumiya、Takayoshi Miura、Kiyoshi Shirai、Takeo Matsuki、Kazuyoshi Torii、Yasuo Nara(1.Semiconductor Leading Edge Technologies, Inc. (Selete)、2.Hitachi, Ltd., Central Research Laboratory)
