2005 International Conference on Solid State Devices and Materials
2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan
[A-3-1]Dielectric Constant Behavior of Hf-O-N System
Tsunehiro Ino、Yuuichi Kamimuta、Masamichi Suzuki、Masato Koyama、Akira Nishiyama(1.Advanced LSI Technology Laboratory, Corporate Research and Development Center, TOSHIBA Corporation)