[A-4-2]A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors
Rino Choi、B. H. Lee、H. K. Park、C.D. Young、J.H. Sim、S.C. Song、G. Bersuker(1.SEMATECH、2.IBM assignee、3.Gwanju Institute of Science and Technology)
