2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan
International Conference on Solid State Devices and Materials
2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan

[A-4-2]A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors

Rino Choi、B. H. Lee、H. K. Park、C.D. Young、J.H. Sim、S.C. Song、G. Bersuker(1.SEMATECH、2.IBM assignee、3.Gwanju Institute of Science and Technology)
https://doi.org/10.7567/SSDM.2005.A-4-2