2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan
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International Conference on Solid State Devices and Materials
2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan

[B-2-1]Examination of the Universality of Hole Mobility in Strained-Si p-MOSFETs

Shinichi Takagi、Koji Takeda、Satoshi Sugahara、Toshinori Numata(1.Graduate School of Frontier Science、2.School of Engineering, The Univ. of Tokyo、3.MIRAI(ASET))
https://doi.org/10.7567/SSDM.2005.B-2-1
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