2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan
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International Conference on Solid State Devices and Materials
2005 International Conference on Solid State Devices and Materials

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜9月15日International Conference Center Kobe, Kobe, Japan

[B-3-2]Si Substrate Orientation Induced Worse Hot Carrier Degradation in Novel (110)/<111’> Oriented Devices

Sinclair Chiang、M.F. Lu、Y.C. Liu、S. Huang-Lu、W.T. Shiau、S.C. Chien(1.Central Research and Development Division, UMC)
https://doi.org/10.7567/SSDM.2005.B-3-2
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