2009 International Conference on Solid State Devices and Materials
2009年10月6日〜10月9日Sendai Kokusai Hotel, Miyagi, Japan
[A-3-1]Carbon Incorporation into Substitutional Silicon Site by Molecular Carbon Ion Implantation and Recrystallization Annealing for Stress Technique in nMOSFETs
H. Itokawa1、K. Miyano1、Y. Oshima1、I. Mizushima1、K. Suguro1(1.Toshiba Corp.)