[B-2-2]Lanthanoid Metal Oxide MIM Capacitors for Precision Analog Circuits: Material Screening, Process Development, and Characterization
J. D. Chen1、J. J. Yang1、R. Wise2、P. Steinmann2、C. Zhu1、Y. C. Yeo1(1.National Univ. of Singapore(Singapore)、2.Texas Instruments Inc.(USA))
