2013 International Conference on Solid State Devices and Materials

2013 International Conference on Solid State Devices and Materials

2013年9月24日〜9月27日Hilton Fukuoka Sea Hawk, Fukuoka, Japan
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International Conference on Solid State Devices and Materials
2013 International Conference on Solid State Devices and Materials

2013 International Conference on Solid State Devices and Materials

2013年9月24日〜9月27日Hilton Fukuoka Sea Hawk, Fukuoka, Japan

[A-7-3]Study on nano-scale threshold switching behavior of NbOx film for ReRAM selector application

Y.M. Koo1、Y.H. Choi1、E.J. Cha1、D.S. Lee1、J.Y. Woo1、J.H. Song1、K.B. Moon1、J.S. Park1、S.H. Lee1、H.S. Hwang1(1.Pohang Univ. of Sci. and Tech. (Korea))
https://doi.org/10.7567/SSDM.2013.A-7-3
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