16th International Symposium on Atomic Level Characterizations for New Materials and Devices '26（ALC'26）
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Presentation Information

[Tu-P-37]Development of Tomographic Field Ion Microscope Assisted by Object Detection Model

Jiayu Li1, Mahito Inoue1, Tatsuo Iwata1, *Shigekazu Nagai1 (1. Mie University (Japan))

Keywords:

Field ion microscopy,Tomographic imaging,Machine learning

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