Presentation Information

[We-P-39]Evaporation Field of Niobium Oxides during Field-Induced Oxygen Etching by Using Pulsed Voltage Atom Probe

*Yuto Niiyama1, Tatsuo Iwata1, Shigekazu Nagai1 (1. Mie-University (Japan))

Keywords:

Atom Probe,Oxidation


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