[MdJZ7QKR] Tu-Poster-A

[Tu-P-13] Development of a Low-Noise, Wide-Bandwidth Optical Beam-Deflection Detection System for Higher Eigenmode Atomic Force Microscopy

*Zheng Rong Guo^1,2, Sebastian Nikolaus Strube-Grützner¹, Chung Kai Fang¹, Hsien Shun Liao², Ing Shouh Hwang¹ (1. Institute of Physics, Academia Sinica (Taiwan), 2. National Taiwan University (Taiwan))

Keywords:

Atomic force microscopy,Optical beam deflection,frequency modulation,Higher eigenmode AFM