Presentation Information
[Th-B3-03]Development of Laser- and Soft-X-ray-Based Photoemission Microscopy Systems for Spin-Resolved and Operando Measurements
*Koichiro Yaji Yaji1,2,3, Shunsuke Tsuda1 (1. Center for Basic Research on Materials, National Institute for Materials Science (Japan), 2. Unprecedented-scale Data Analytics Center, Tohoku University (Japan), 3. Photon Science Innovation Center (Japan))
Keywords:
Angle-resolved photoemission microscopy,Electronic properties,laser,synchrotron radiation
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