[xc7LS2E1] We-Poster-B

[We-P-16] Full-tilt-angle/fast TEM tomography for submicron-sized particles

*Subaru Sato¹, Hiroshi Nakajima², Hiroya Miyazaki³, Takeharu Kato⁴, Jun Yamasaki^2,5 (1. School of Engineering, The University of Osaka (Japan), 2. Research Center for UHVEM, The University of Osaka (Japan), 3. Mel-Build Corporation (Japan), 4. Japan Fine Ceramics Center (Japan), 5. IMaSS ,Nagoya University (Japan))

Keywords:

Full-tilt-angle tomography,Fast tomography,Submicron particle,Specimen vibration