Presentation Information
[Tu-P-53]Modulating Bismuth-TMD Interface Electronic Properties through Phase and Defect Control
*Liang-Cheng Yu1, Yong-Long Zheng1, Yen-Yu Lai1, Chun-Liang Lin1 (1. National Yang Ming Chiao Tung University (Taiwan))
Keywords:
STM/STS,Phase Engineering,Defect Engineering
Comment
To browse or post comments, you must log in.Log in
