Presentation Information

[Tu-P-27]Physical Bayesian Neural Networks for Out-of-Distribution Detection

*En-Hau Jeng1, Shih-Chuan Hung1, Sheng-Chung Chen2, Der-Hsien Lien1 (1. Institute of Electronics, National Yang Ming Chiao Tung University (Taiwan), 2. Institute of Pioneer Semiconductor Innovation, National Yang Ming Chiao Tung University (Taiwan))

Keywords:

CMOS inverter,Bayesian neural network,out-of-distribution detection,rejection sampling


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