Presentation Information

[We-A5-04]Near-Ambient Pressure XPS Analysis of Electronic States in SWCNTs

*Takahiro Nishio1, Masafumi Horio2, Takanobu Kajino1, Kanako Ochiai1, Hiroshi Okada3, Yutaka Matsuo3, Iwao Matsuda2, Yoshimasa Hijikata1 (1. DENSO CORPORATION (Japan), 2. Institute for Solid State Physics, The University of Tokyo (Japan), 3. Department of Chemical Systems Engineering, Nagoya University (Japan))

Keywords:

Near-Ambient Pressure XPS,SWCNT,NanoTerasu


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