16th International Symposium on Atomic Level Characterizations for New Materials and Devices '26（ALC'26）
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Session Details

Advanced Technique

[Fr-A1]Sub-Molecular Resolution SPM & Tip-Enhanced Spectroscopy

Fri. Nov 6, 2026 9:00 AM - 10:20 AM
Room A (Main Room)
Chair: Tomohiro Hayashi (Institute of Science Tokyo), Naoka Nagamura (National Institute for Materials Science)
9:00 AM - 9:30 AMINVITED

[Fr-A1-01]Sub-molecular resolution cryogenic AFM: breaking the speed limit with Si cantilevers

*Yuuki Yasui1, Yoshiaki Sugimoto1 (1. The University of Tokyo (Japan))
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9:30 AM - 9:50 AM

[Fr-A1-02]From Spectroscopic Images to Atomic Coordinates: Deep Learning for Structure Determination of Single Molecules from Tip-enhanced Raman Spectromicroscopy

*Yao Zhang1 (1. Univeristy of Science and Technology of China (China))
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9:50 AM - 10:20 AMINVITED

[Fr-A1-03]In Situ and Ex Situ Techniques for Atomic- and Molecular-Scale Characterizations of Electrochemical Interfaces

*Yasuyuki Yokota1 (1. RIKEN (Japan))
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