Presentation Information
[TuB1-06]Uncooled, Ultrasensitive Terahertz Bolometric Detection Using Silicon Nitride Nanoelectromechanical-System Beam Resonators
〇Yuto Amano1, Akira Kojima1, Nobuyoshi Koshida1, Ya Zhang1 (1. Tokyo Univ. of Agri. and Tech. (Japan))
Terahertz (THz) detectors using MEMS/NEMS resonators have attracted growing interest due to their high sensitivity and fast response under room-temperature operation. Here, we report silicon nitride (SiN) doubly clamped NEMS beam resonators for high sensitivity THz bolometric sensing applications. The PECVD deposited SiN film contains a significant tensile stress, allowing the fabrication of ultra-thin NEMS beams with a thickness of ~50 nm. This device shows an ultrahigh thermal sensitivity with a noise-equivalent power (NEP) of 0.58 pW/√Hz, significantly outperforming conventional room-temperature THz thermal detectors.
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