Presentation Information
[TuP3D-04]Origin of low dark current operation of InAs/GaAs(111)A infrared detectors: Effects of residual impurities on GaAs substrates
〇Takaaki Mano1, Nobuyuki Ishida1, Takuya Kawazu1, Akihiro Ohtake1, Hideki T. Miyazaki1 (1. National Institute for Materials Science (NIMS) (Japan))
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