Presentation Information
[TuP3H-01]In-situ Impedance Spectroscopy for Tracking Thermal Surfactant Removal from semiconducting SWCNT Thin Films
〇Kyohei Shiota1, Shinya Kawano1, Yoshiki Hidaka1, Yuki Kuwahara2, Takeshi Saito2, Kenichi Goushi1, Kenji Ishida1 (1. Kyushu Univ. (Japan), 2. Natl. Inst. Adv. Indus. Sci. Tech. (Japan))
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