The 66th Battery Symposium in Japan
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Presentation Information

11:40 AM - 12:00 PM JST(2:40 AM - 3:00 AM UTC)

[3MH09]レーザ照射法によるダメージセルの安全性低下現象の把握

*Keizoh Honda1, Hideki Tsuruga1, Tomokazu Morita2, Kenichiroh Koshika3 (1. JET, 2. Toshiba corporation, 3. NTSEL)

Keywords:

Safety degradation,Laser irradiation,Thermal runaway

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