Session Details
[2F01-04]PEMFC
Wed. Nov 25, 2026 9:00 AM - 10:20 AM JST
Wed. Nov 25, 2026 12:00 AM - 1:20 AM UTC
Wed. Nov 25, 2026 12:00 AM - 1:20 AM UTC
Hall F(3F G312/G313 satellite G311)
[2F01]高温運転条件がPEFC電解質膜の劣化挙動に及ぼす影響
*Chunyan Li1, Hiroyuki Kanesaka1, Toshikazu Ogino1, Hiroki Kusakabe1 (1. FC-Cubic Association (Japan))
[2F02]PEFC高温低加湿運転による触媒層(アイオノマー)、電解質膜劣化への影響
*Sana Kawashita1, Hiroyuki Kanesaka1, Hiroki Kusakabe1, Chunyan Li1 (1. FC-Cubic Association (Japan))
[2F03]テンダーX線吸収分光による高分子電解質膜の電子状態解析
*NAOYA KURAHASHI1, HIROKI SUGA2, KIYOFUMI NITTA2, Yoshiyuki Ohtsubo1, MASAHIRO RIKUKAWA3 (1. National Institutes for Quantum Science and Technology (Japan), 2. JASRI (Japan), 3. Sophia University (Japan))
[2F04]高酸素透過性イオノマーによるPt/MPCカソード触媒の電池特性向上要因解析
*Kazuki Yuasa1, Hideo Daimon1, Takayuki Doi1, Hideo Inoue2, Minoru Inaba1 (1. Doshisha University (Japan), 2. ISHIFUKU Metal Industry Co., Ltd. (Japan))
