The Institute of Electronics, Information and Communication Engineers General Conference
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2:00 PM - 2:15 PM JST(5:00 AM - 5:15 AM UTC)Candidate for Academic Incentive Award

[A-19-02]Attack accuracy evaluation by backside voltage fault injection

○Yusuke Hayashi1, Rikuu Hasegawa1, Takuya Wadatsumi1, Kazuki Monta1, Takuji Miki1, Makoto Nagata1 (1. Kobe Univ.)
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Keywords:

Fault injection attack,backside voltage fault injection

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