[B-4] 環境電磁工学

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)

[B-4-03] Effect of Common-Mode Choke Characteristics on Signal Integrity in BCI Test

○Hiroya Ueyama¹, Naoki Iida¹, Yoshiki Kayano², Fengchao Xiao², Yoshio Kami² (1. Murata Manufacturing, 2. Univ. Electro-Communications)

Keywords:

BCI test,Mode conversion