[B-4] 環境電磁工学

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)

[B-4-24] Validation of ESD current waveform measured by optical voltage sensor using ESD Simulator calibration set-up

○Takahiro Horiguchi¹, Noriyuki Fukui¹, Eiji Taniguchi¹ (1. Mitsubishi Electric Corporation)

Keywords:

EMC,ESD,Immunity,Optical voltage sensor