The Institute of Electronics, Information and Communication Engineers General Conference
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Presentation Information

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)

[B-4-24]Validation of ESD current waveform measured by optical voltage sensor using ESD Simulator calibration set-up

○Takahiro Horiguchi1, Noriyuki Fukui1, Eiji Taniguchi1 (1. Mitsubishi Electric Corporation)

Keywords:

EMC,ESD,Immunity,Optical voltage sensor

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