Presentation Information

[BCI-1-01]Material Characterization Techniques at Millimeter-Wave and Sub-Terahertz Frequency Bands for Beyond-5G/6G Applications

○Yuto Kato1, Tomonori Arakawa1 (1. AIST)
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Keywords:

Material characterization,Complex permittivity measurement,Conductivity measurement,Balanced-type circular disk resonator