Presentation Information
[BCI-1-01]Material Characterization Techniques at Millimeter-Wave and Sub-Terahertz Frequency Bands for Beyond-5G/6G Applications
○Yuto Kato1, Tomonori Arakawa1 (1. AIST)
Keywords:
Material characterization,Complex permittivity measurement,Conductivity measurement,Balanced-type circular disk resonator