The Institute of Electronics, Information and Communication Engineers General Conference
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Presentation Information

2:20 PM - 2:50 PM JST(5:20 AM - 5:50 AM UTC)

[BI-12-02]Precision Electric Field Measurement Underpinning the Reliability of EMC Tests

○Takehiro Morioka1 (1. AIST)

Keywords:

EMC,E-field strength,Precision measurement,Uncertainty

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