General Conference of the Institute of Electronics, Information and Communication Engineers
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Presentation Information

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[B-12-08]High-Precision OTN Delay Measurement Using Vernier Scales

〇Kengo Shintaku1, Shion Omichi1, Takuya Ohara1 (1. NTT Corporation)

Keywords:

Optical Transport Network,Delay Measurement,Vernier Scales

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