Presentation Information
[B-13_B10A-03]Sub-nano Displacement Measurement by Passive Optics with Elliptically Polarized Reference Light
〇Ayumi Ito1, Masanori Hanawa1, Yasuhiro Okamura1 (1. University of Yamanashi)
Keywords:
Elliptical Polarization,Displacement Measurement,Sub-Nanometer,Digital Coherent Reception,Inter-polarization phase difference