Presentation Information
[B-15-34]Device Identification Based on RF Circuit Imperfections for Large-scale Heterogeneous ZigBee Devices
〇Shota Nakano1, Kota Mizumachi1, KOMATSU Kazuki1, Yuichi Miyaji2, Hideyuki Uehara1 (1. Toyohashi University of Technology, 2. Aichi Institute of Technology)
Keywords:
Device identification,Frequency offset,IQ imbalance,Machine learning