General Conference of the Institute of Electronics, Information and Communication Engineers
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Presentation Information

4:15 PM - 4:30 PM JST(7:15 AM - 7:30 AM UTC)

[D-12-73]Study on an automatic visual inspection for metal components using Generative Adversarial Networks

〇Ryosuke Kaizu1, Yoshinori Yamashita2, Kazuhide Hasegawa2, Kazuki Sakai1 (1. National Institute of Technology, Nagaoka College., 2. Joetsu Bronz1 Corporation.)

Keywords:

Generative Adversarial Networks,Visual inspection

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