Presentation Information
[NC-2-03]Influence of threading dislocations on surface pit characteristics in 4H-SiC epitaxial wafers via non-destructive identification
*Juhyeong Sun1, Kousei Takahashi2, Yasutaka Matsubara2, Michio Kawase2, Keisuke Seo2, Kenta Murayama3, Kentaro Kutsukake1,2, Toru Ujihara1,2, Shunta Harada1,2 (1. Graduate School of Engineering, Nagoya University, Japan, 2. Institute of Materials and Systems for Sustainability (IMaSS), Nagoya University, Japan, 3. Mipox Corporation, Japan)
