[NC-003] Nano-scale Characterization of the Structure and Properties of Sustainable Materials 3

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[NC-3-01] TEM analysis of stacking structure at the highly oriented MoS₂/sapphire interface

*Emi Kano¹, Jun Nara², Toshiki Yasuno¹, Ryota Tanaka¹, Xu Yang¹, Keisuke Atsumi³, Shuhong Li³, Kosuke Nagashio³, Yoshiki Sakuma², Nobuyuki Ikarashi¹ (1. Nagoya University, 2. NIMS, 3. University of Tokyo)