Presentation Information
[NC-P-2-10]Evaluation of the depth resolution of SE imaging using twisted MoS2
*Taichi Miura1, Rei Usami1, Taishi Takenobu1, Keisuke Igarashi2, Takeshi Sato2, Hiroaki Matsumoto2, Hiromi Inada2, Koh Saitoh3 (1. Graduate School of Engineering, Nagoya Univ., Nagoya, Japan, 2. Hitachi High-Tech.Co., Hitachinaka, Japan, 3. IMaSS, Nagoya Univ., Nagoya, Japan)