Presentation Information
[OS19-P2-01]Deep Learning-Based Data Analysis for Imaging Ellipsometry
*Taisei Inoue1, Yuki Harada1, Eiichi Kondoh1, Yasuhiro Mizutani2, Bernard Gelloz3, Lianhua Jin1 (1. Univ. of Yamanashi, 2. Univ. of Osaka, 3. Nagoya Univ.)
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