Presentation Information
[OS06-P1-01]Grinding quality monitoring using internal machine power signal and machine learning
*PENGFEI ZHANG1, Shun Tanaka1, Ryota Kobayashi1, Hiroyuki Kamura2, Kenichi Yamanouchi2, Naohiko Sugita1 (1. The University of tokyo, 2. DAIKIN INDUSTRIES, LTD.)
Password required to view
Comment
To browse or post comments, you must log in.Log in