Presentation Information

[Th-A1-F-02]High-Throughput Charge Noise Characterization Framework
for CMOS-based Spin-Qubit Devices

〇Emmanuel Chanrion1, Sam Fiette1, Mathilde Ouvrier-Buffet1, Gaëtan Cussac1, Amine Torki1, Franck Sabatier1, Ysaline Renaud1, Peter Samaha1, Bruna Cardoso Paz2, Maud Vinet2, Gregoire Roussely1, Benoit Bertrand1, Heimanu Niebojewski1, Yann Beilliard1, Pierre-André Mortemousque1 (1. CEA-LETI (France), 2. Quobly (France))

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