Presentation Information
[Th-P-42]Self-Consistent Electronic Modeling of Gated Narrow-Gap Topological Insulators
〇Maximilian Hofer1,2, Christopher Fuchs1,2, Moritz Siebert1,2, Christian Berger1,2, Lena Fürst1,2, Martin P. Stehno1,2, Steffen Schreyeck1,2, Hartmut Buhmann1,2, Tobias Kießling1,2, Wouter Beugeling1,2, Laurens W. Molenkamp1,2 (1. Inst. for Topological Insulators, Univ. of Würzburg (Germany), 2. Inst. of Physics (EP3), Univ. of Würzburg (Germany))